마이크로프랜드

Patents and Certificates

No. Classification Patent name Note
39 [Domestic] SUPPORTING ASSEMBLY FOR PROBE CARD
38 [Domestic] PROBE SHEET WITH CONTACT TIP ON STACKED MULTI-LAYER AND METHOD OF MANUFACTURING THE SAME
37 [Overseas] CONTACTOR BLOCK OF SELF-ALIGNING VERTICAL PRBOE CARD AND MANUFACTURING METHOD THEREFOR
36 [Overseas] PROBE INCLUDING AN ALIGNMENT KEY PROTRUDED FROM A SIDE OF AN ALIGNMENT BEAM AND PROBE CARD INCLUDING THE SAME
35 [Overseas] SEMICONDUCTOR DEVICE TEST SOCKET(B)
34 [Overseas] TEST SOCKET
33 [Overseas] CONTACTOR BLOCK OF SELF-ALIGNING VERTICAL PRBOE CARD AND MANUFACTURING METHOD THEREFOR
32 [Domestic] SELF-ALIGNED CONTACT BLOCK OF VERTICAL PROBE CARD AND MANUFACTURING METHOD OF THE SAME
31 [Domestic] TEST SOCKET
첫페이지로 1 다음 마지막페이지로

닫기 -