39 |
[Domestic] |
SUPPORTING ASSEMBLY FOR PROBE CARD |
|
38 |
[Domestic] |
PROBE SHEET WITH CONTACT TIP ON STACKED MULTI-LAYER AND METHOD OF MANUFACTURING THE SAME |
|
37 |
[Overseas] |
CONTACTOR BLOCK OF SELF-ALIGNING VERTICAL PRBOE CARD AND MANUFACTURING METHOD THEREFOR |
|
36 |
[Overseas] |
PROBE INCLUDING AN ALIGNMENT KEY PROTRUDED FROM A SIDE OF AN ALIGNMENT BEAM AND PROBE CARD INCLUDING THE SAME |
|
35 |
[Overseas] |
SEMICONDUCTOR DEVICE TEST SOCKET(B) |
|
34 |
[Overseas] |
TEST SOCKET |
|
33 |
[Overseas] |
CONTACTOR BLOCK OF SELF-ALIGNING VERTICAL PRBOE CARD AND MANUFACTURING METHOD THEREFOR |
|
32 |
[Domestic] |
SELF-ALIGNED CONTACT BLOCK OF VERTICAL PROBE CARD AND MANUFACTURING METHOD OF THE SAME |
|
31 |
[Domestic] |
TEST SOCKET |
|